Hugendubel.de - Das Lesen ist schön

Warenkorb

€ 0,00 0 Buch dabei,
portofrei
Bücher immer versandkostenfrei
Klick ins Buch Applied Scanning Probe Methods I als Buch
PORTO-
FREI

Applied Scanning Probe Methods I

'Nanoscience and Technology'. Auflage 2004. Book. Sprache: Englisch.
Buch (gebunden)
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and ... weiterlesen
Buch

244,99*

inkl. MwSt.
Portofrei
Sofort lieferbar
Applied Scanning Probe Methods I als Buch
Produktdetails
Titel: Applied Scanning Probe Methods I

ISBN: 3540005277
EAN: 9783540005278
'Nanoscience and Technology'.
Auflage 2004.
Book.
Sprache: Englisch.
Herausgegeben von Bharat Bhushan, Harald Fuchs, Sumio Hosaka
Springer Berlin Heidelberg

13. Januar 2004 - gebunden - 500 Seiten

Beschreibung

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques willbenefit from the international perspective assembled in the book.

Inhaltsverzeichnis

Part I: Scanning Probe Microscopy.- A. Schirmeisen, B. Ancykowski, H. Fuchs: Dynamic Force Microscopy. J.E. Houston: Interfacial Force Microscopy: Selected Applications. Volker Scherer, Michael Reinstaedtler, Walter Arnold: Atomic Force Microscopy with Lateral Modulation. E.Oesterschulze, R. Kassing: Sensor Technology for Scanning Probe Microscopy. J.S. Villarrubia: Tip Characterization for Dimensional Nanometrology.- Part II: Characterization.- Bharat Bhushan: Micro/Nanotribology and Materials Characterization Studies Using Scanning Probe Microscopy. Sergei Magonov: Visualization of Polymer Structures with Atomic Force Microscopy. Juergen Keller, Dietmar Vogel, Andreas Schubert, and Bernd Michel: Displacement and Strain Field Measurements from SPM Images. Ndubuisi G. Orji, Martha I. Sanchez, Jay Raja, and Theodore V. Vorburger: AFM Characterization of Semiconductor Line Edge Roughness. Redhouane Henda: Mechanical Properties of the Self-Assembled Organic Monolayers: Experimental Techniques and Modeling Approaches. LiShi and Arun Majumdar: Micro-Nano Scale Thermal Imaging Using Scanning Probe Microscopy. Gustavo Luengo, Frederic Leroy: The Science of Beauty at Small Scale. Applications of Scanning Probe Methods on Cosmetic Science.- Part III: Industrial Applications.- S. Hosaka: SPM Based Storage Using Atomic Manipulation and Surface Modification. J. Tominaga: Super Density Optical Data Storage by Near-Field Optics. R. Yamamoto, K. Sanada, S. Umemura. R: Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM). K. Matsumoto: Room-Temperature Single Electron Devices Formed ba AFM Nano-Oxidation Process.

Pressestimmen

From the reviews:
"The editors have done an excellent job of maintaining a coherent theme throughout, while keeping the repetition of ideas to a minimum. It is therefore effective when read as a whole but will also find good use as a reference book."....."This is an excellent book for all users of SPM interested in real technological applications".
Steven R. Schofield, School of Mathematical and Physical Sciences, University of Newcastle
Journal: "The Physicist", Vol. 41, No. 6, p. 200
"This book describes some of the many ways in which SPMs are being used in the development and characterisation of real nano technological processes and devices. The editors have done an excellent job of maintaining a coherent theme throughout ... . It is therefore effective when read as a whole but will also find good use as a reference book. ... This is an excellent book for all users of SPM interested in real technological applications." (Steven R Schofield, The Physicist, Vol. 41 (6), November/December, 2004)
"The focus of this book is recent, practical applications of scanning probe microscopy (SPM). Because it is written by leading experts in SPM techniques, the book is strongly recommended to those working in the emerging area of nanotechnology. ... Each chapter contains the relevant references and the book ends with a comprehensive index." (Mircea Dragoman, Optics and Photonics News, April, 2006)
Servicehotline
089 - 70 80 99 47

Mo. - Fr. 8.00 - 20.00 Uhr
Sa. 10.00 - 20.00 Uhr
Filialhotline
089 - 30 75 75 75

Mo. - Sa. 9.00 - 20.00 Uhr
Bleiben Sie in Kontakt:
Sicher & bequem bezahlen:
akzeptierte Zahlungsarten: Überweisung, offene Rechnung,
Visa, Master Card, American Express, Paypal
Zustellung durch:
* Alle Preise verstehen sich inkl. der gesetzlichen MwSt. Informationen über den Versand und anfallende Versandkosten finden Sie hier.
** im Vergleich zum dargestellten Vergleichspreis.