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Design and Test of Integrated Inductors for RF Applications

Auflage 2003. Book. Sprache: Englisch.
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Intended for engineers who are starting out in the design of integrated inductors, this book describes the whole design flow, basic selection of the geometry and optimisation of the quality by redesigning the geometry, measurement and de-embedding an... weiterlesen
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Produktdetails

Titel: Design and Test of Integrated Inductors for RF Applications
Autor/en: Jaime Aguilera, Roc Berenguer

ISBN: 1402076762
EAN: 9781402076763
Auflage 2003.
Book.
Sprache: Englisch.
Springer US

30. November 2003 - gebunden - 212 Seiten

Beschreibung

Intended for engineers who are starting out in the design of integrated inductors, this book describes the whole design flow, basic selection of the geometry and optimisation of the quality by redesigning the geometry, measurement and de-embedding and characterisation.

Inhaltsverzeichnis

Dedication. List of Figures. List of Tables. List of Abbreviations. Preface.
1: Introduction. 1. Conventional IC fabrication technologies. 2. Keys to progress in RF transceiver design: High Q integrated inductors. 3. The challenge of integrating high quality inductors. 4. Structure of the book.
2: General considerations. 1. Ways of of integrating an inductor. 2. Spiral inductors on silicon based technologies.
3: Inductor's test and characterization. 1. On wafer measuring equipment. 2. Measuring accuracy and repeatability. 3. Measuring configuration: 1-port versus 2-port configuration. 4. Test fixture design. 5. De-embedding techniques. 6. Pi model inductor characterization.
4: Influence of the geometric parameters on the inductor's performance: Design rules. 1. Problem description. 2. Analytical study and simulations. 3. Empirical study. 4. Design considerations.
5: Inductor's design flow. 1. Generation phase. 2. Filtering phase. 3. Performance estimation phase. 4. Verification phase.
Appendix. References. Index.
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