
Inhaltsverzeichnis
Introduction. - Physics of Degradation. - Time Dependence of Materials and Device Degradation. - From Material/Device Degradation to Time-To-Failure. - Time-To-Failure Modeling. - Gaussian Statistics - An Overview. - Time-To-Failure Statistics. - Failure Rate Modeling. - Accelerated Degradation. - Acceleration Factor Modeling. - Ramp-To-Failure Testing. - Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits. - Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering. - Conversion of Dynamical Stresses Into Effective Static Values. - Resonance and Resonance-Induced Degradation. - Increasing the Reliability of Device/Product Designs. - Screening. - Heat Generation and Dissipation. - Sampling Plans and Confidence Intervals. -
Reliability Physics and Engineering: Time-to-Failure Modeling presents good technical insights into advance reliability physics theories and modeling, suitable for both industry and academic practitioners. The authors provide insights into the broad values and technical applications of reliability and safety engineering in this book. Valuable as a learning tool reliability physics and modeling, its clear relevance to real-world industry practices make it useful for both academics and semiconductor industry practitioners. (Chong Leong Gan, Life Cycle Reliability and Safety Engineering, Vol. 9, 2020)
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