Characterizing the nature of short-wavelengthelectromagnetic (EM) field quantities within largecomplicated enclosures poses a significant challengein the field of microwave engineering. Thisproblem manifests itself in many situations such ascellular-signal penetration into buildings, speciousEM emissions from personal electronic devices insideaircrafts, or the upset of electronic systems due tointentional EM interference threats. In many suchcases, the inherent complexity of the enclosuremakes a deterministic solution of the internal EMfield quantities infeasible, and instead calls for astatistical approach to describe the nature ofthese quantities. The Random Coupling Model issuch a statistical approach and is discussed in thisbook. The Random Coupling Model treats the enclosureas a wave-chaotic system andpredicts "universal" wave-fluctuationswhose properties depend only upon the value of asingle loss-parameter. The predictionsof this model are experimentally validated, and theinsights gained suggest design-guidelines forEM-hardening of enclosures to the disruptiveeffects produced by short-wavelength EM radiation.
