Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Inhaltsverzeichnis
Method for Precise Force Measurements. - Force Spectroscopy on Semiconductor Surfaces. - Tip#x2013; Sample Interactions as a Function of Distance on Insulating Surfaces. - Force Field Spectroscopy in Three Dimensions. - Principles and Applications of the qPlus Sensor. - Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond. - Atom Manipulation on Semiconductor Surfaces. - Atomic Manipulation on Metal Surfaces. - Atomic Manipulation on an Insulator Surface. - Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM. - Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces. - Magnetic Exchange Force Microscopy. - First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001). - Frequency Modulation Atomic Force Microscopy in Liquids. - Biological Applications of FM-AFM in Liquid Environment. - High-Frequency Low Amplitude Atomic Force Microscopy. - Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
